Several key techniques have been developed and refined to improve visualization in nanotechnology:
1. Scanning Electron Microscopy (SEM): SEM provides high-resolution images by scanning a focused beam of electrons over the surface of a sample. It is particularly useful for examining the surface morphology and composition of materials.
2. Transmission Electron Microscopy (TEM): TEM offers even higher resolution than SEM by transmitting electrons through a thin sample. This technique is essential for studying the internal structure and composition of nanomaterials.
3. Atomic Force Microscopy (AFM): AFM uses a cantilever with a sharp tip to scan the surface of a sample. It can produce three-dimensional images at the nanoscale and is beneficial for measuring surface roughness and other physical properties.
4. Scanning Tunneling Microscopy (STM): STM generates images by measuring the tunneling current between a sharp tip and the sample surface. It is capable of imaging individual atoms and molecules, making it a powerful tool for studying surface atoms.
