Several tools are essential in nanotechnology, each serving unique purposes:
1. Atomic Force Microscopy (AFM): AFM is a type of scanning probe microscopy that measures the force between a sharp probe and the surface at a very close range. It provides high-resolution imaging of surfaces at the atomic scale. 2. Scanning Tunneling Microscopy (STM): STM allows for the visualization of individual atoms on a material's surface by measuring the tunneling current between a conductive tip and the surface. 3. Transmission Electron Microscopy (TEM): TEM uses a beam of electrons to pass through a specimen, providing detailed images of the internal structure at the nanoscale. 4. Scanning Electron Microscopy (SEM): SEM scans a sample with a focused beam of electrons to produce high-resolution images of the surface topography and composition. 5. X-ray Diffraction (XRD): XRD analyzes the crystallographic structure of materials by measuring the diffraction patterns of X-rays scattered by the atoms in the sample.
