What are the Key Techniques Used in Surface Imaging?
Several advanced techniques are employed for surface imaging in nanotechnology:
1. Atomic Force Microscopy (AFM): This technique uses a cantilever with a sharp tip to scan the surface. AFM can provide high-resolution images and measure various properties such as roughness, mechanical properties, and surface forces.
2. Scanning Tunneling Microscopy (STM): STM operates by measuring the tunneling current between a conductive tip and the surface. It offers atomic-level resolution and is particularly useful for studying conductive materials.
3. Scanning Electron Microscopy (SEM): SEM uses a focused beam of electrons to produce high-resolution images. It is widely used for examining surface morphology and composition.
4. Transmission Electron Microscopy (TEM): TEM involves transmitting electrons through a sample to obtain detailed images of its internal structure. It is essential for studying the crystalline structure and defects at the nanoscale.
