nanometrology

What are the Key Techniques in Nanometrology?

Several techniques are employed in nanometrology to measure different properties, including:
Atomic Force Microscopy (AFM): Measures surface topography with nanometer resolution.
Scanning Electron Microscopy (SEM): Provides high-resolution images of surfaces.
Transmission Electron Microscopy (TEM): Used for internal structural analysis at the atomic level.
X-ray Diffraction (XRD): Determines crystalline structures and phases.
Nanoindentation: Measures mechanical properties such as hardness and elasticity.

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