Scanning Electron Microscopy (SEM) SEM provides high-resolution images of surfaces by scanning them with a focused beam of electrons. It’s widely used to study surface topography and composition.
Transmission Electron Microscopy (TEM) TEM allows for the observation of the internal structure of nanomaterials by transmitting electrons through a thin specimen. It provides detailed information about the morphology, crystallography, and composition.
Atomic Force Microscopy (AFM) AFM uses a cantilever with a sharp tip to scan the surface of a sample. It can measure the forces between the tip and the sample, providing 3D images of the surface at atomic resolution. AFM is essential for studying surface characteristics like roughness and mechanical properties.
X-ray Diffraction (XRD) XRD is utilized for identifying the crystalline structure of materials. By measuring the scattering of X-rays, it provides information about the phase composition and crystallographic structure of nanomaterials.
Dynamic Light Scattering (DLS) DLS measures the size distribution of particles in a solution by analyzing the pattern of light scattered by the particles. It is particularly useful for characterizing nanoparticles in colloidal suspensions.
Raman Spectroscopy Raman Spectroscopy involves the inelastic scattering of light to provide information about molecular vibrations and composition. It is highly effective for analyzing the chemical structure and properties of nanomaterials.
