Noise measurement in nanotechnology typically involves the following techniques:
1. Spectral Analysis: This involves analyzing the frequency components of the noise. Techniques such as Fast Fourier Transform (FFT) are used to convert time-domain signals into their frequency components.
2. Scanning Probe Microscopy (SPM): SPM techniques, such as atomic force microscopy (AFM) and scanning tunneling microscopy (STM), can be used to study noise at the nanoscale.
3. Electrical Measurements: Tools such as lock-in amplifiers and spectrum analyzers are employed to measure electrical noise in nanoscale circuits.
