What are the Common Techniques Used in Nanoscale Imaging?
Several techniques are commonly used for nanoscale imaging, each with its own strengths and applications:
Scanning Electron Microscopy (SEM): SEM uses focused beams of electrons to create detailed images of surfaces. It provides high-resolution images and is widely used in both research and industry. Transmission Electron Microscopy (TEM): TEM transmits electrons through a sample to form an image. It offers higher resolution than SEM and can reveal internal structures at atomic resolution. Atomic Force Microscopy (AFM): AFM uses a cantilever with a sharp tip to scan the surface of a sample. It can measure surface topography at the nanoscale and is particularly useful for analyzing non-conductive materials. Scanning Tunneling Microscopy (STM): STM measures the tunneling current between a conductive tip and the sample surface. It provides atomic-level resolution and is used to study conductive materials. X-ray Diffraction (XRD): XRD analyzes the diffraction patterns of X-rays passing through a crystal structure. It helps determine the atomic and molecular structure of materials.
