What are the Common Techniques Used in Data Acquisition?
Several techniques are commonly used for data acquisition in nanotechnology. Some of the most prominent ones include: - Atomic Force Microscopy (AFM): Used to measure surface properties at the nanoscale. - Scanning Electron Microscopy (SEM): Provides high-resolution images of nanoscale structures. - Transmission Electron Microscopy (TEM): Allows for the visualization of internal structures of nanomaterials. - X-ray Diffraction (XRD): Used to determine the crystallographic structure of materials. - Raman Spectroscopy: Provides information on molecular vibrations and material composition.
