What are the Common Techniques Used for Image Acquisition?
Several techniques are employed for image acquisition in nanotechnology, each with its specific advantages and limitations:
- Scanning Electron Microscopy (SEM): SEM uses electrons instead of light to form an image, providing high-resolution and depth of field. It is commonly used to examine surface topography and composition.
- Transmission Electron Microscopy (TEM): TEM passes electrons through a thin sample to form an image, offering even higher resolution than SEM. It is ideal for studying the internal structure of nanomaterials.
- Atomic Force Microscopy (AFM): AFM uses a cantilever with a sharp tip to scan the surface of a sample. It provides topographical information and can also measure various physical properties at the nanoscale.
- Scanning Tunneling Microscopy (STM): STM measures the tunneling current between a conductive tip and the sample surface, allowing for atomic-level resolution imaging.
