What are the Common Non-Destructive Imaging Techniques?
Several non-destructive imaging techniques are commonly used in the field of nanotechnology:
Scanning Electron Microscopy (SEM) SEM uses a focused beam of electrons to produce high-resolution images of surfaces. It provides detailed information about the sample’s morphology and composition.
Transmission Electron Microscopy (TEM) TEM involves transmitting electrons through a sample to obtain images at an atomic resolution. It is widely used for analyzing the internal structure of nanomaterials.
Atomic Force Microscopy (AFM) AFM uses a cantilever with a sharp tip to scan the surface of a sample. It provides topographical maps and can operate in various environments, including liquids.
X-ray Diffraction (XRD) XRD is used to determine the crystallographic structure, composition, and physical properties of materials. It is particularly useful for studying the phase and orientation of nanomaterials.
Raman Spectroscopy Raman Spectroscopy is a non-destructive chemical analysis technique that provides detailed information about the molecular composition and structure of materials.
