What are the Common Nanotechnology Imaging Techniques?
Several imaging techniques are commonly used in nanotechnology:
Scanning Electron Microscopy (SEM): Uses a focused beam of electrons to create high-resolution images of the surface of a sample. Transmission Electron Microscopy (TEM): Passes electrons through a thin sample to form an image, providing information about the internal structure at high resolutions. Atomic Force Microscopy (AFM): Utilizes a cantilever with a sharp tip to scan the surface of a sample, measuring forces between the tip and the sample to generate topographical maps. Scanning Tunneling Microscopy (STM): Measures the tunneling current between a sharp tip and the sample surface to provide atomic-level resolution images. Near-Field Scanning Optical Microscopy (NSOM): Combines optical and scanning probe techniques to achieve resolution beyond the diffraction limit of light.
