data measurement

What are the Common Measurement Techniques?

Several techniques are employed for data measurement in nanotechnology:

1. Atomic Force Microscopy (AFM)
AFM provides high-resolution imaging by scanning a sharp tip over the surface of a sample. It can measure surface topography at the nanoscale.

2. Scanning Electron Microscopy (SEM)
SEM uses focused beams of electrons to generate detailed images of sample surfaces. It is useful for studying surface morphology.

3. Transmission Electron Microscopy (TEM)
TEM transmits electrons through a thin sample to produce high-resolution images. It is particularly effective for analyzing internal structures.

4. X-ray Diffraction (XRD)
XRD measures the diffraction of X-rays by the atomic planes in a crystal. This technique is used to determine crystallographic structures.

5. Dynamic Light Scattering (DLS)
DLS measures the scattering of light by particles in suspension to determine their size distribution.