Several imaging techniques are commonly used in nanotechnology:
1. Scanning Electron Microscopy (SEM): SEM uses a focused beam of electrons to create detailed images of the surface of a sample. It is widely used for its high resolution and depth of field. 2. Transmission Electron Microscopy (TEM): TEM involves transmitting electrons through a specimen to form an image. It provides information about the internal structure of the sample at atomic resolution. 3. Atomic Force Microscopy (AFM): AFM uses a cantilever with a sharp tip to scan the surface of a sample. It provides topographical data with high resolution and can also measure mechanical properties. 4. Scanning Tunneling Microscopy (STM): STM uses a conductive tip to scan a surface at a constant distance, allowing for imaging at atomic resolution. It is particularly useful for studying electrical properties.
