Atomic Force Microscopy (AFM) uses a sharp tip mounted on a cantilever to scan the surface of a sample. As the tip moves across the surface, forces between the tip and the sample cause deflections in the cantilever. These deflections are measured using a laser beam that reflects off the cantilever into a photodetector. By analyzing these deflections, AFM generates high-resolution topographical maps of surfaces, providing insights into the material's physical properties.
