Testing nanocircuits presents several challenges due to their size and complexity. Key challenges include:
- Resolution: Traditional testing methods often lack the resolution needed to detect issues at the nanoscale. - Interference: The small size makes nanocircuits more susceptible to interference from external sources. - Fabrication Variability: Minor inconsistencies in fabrication can have significant impacts on performance. - Complexity: The intricate design of nanocircuits makes it difficult to isolate and identify faults.
