What are the challenges in measuring nanoscale materials?
One of the primary challenges in measuring nanoscale materials is the limitation of traditional measuring tools. At the nanoscale, dimensions are in the range of 1 to 100 nanometers, where conventional instruments like optical microscopes fall short. The resolution of these microscopes is limited by the wavelength of visible light, making them incapable of resolving details at the nanoscale. Advanced tools such as the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM) are required to image and measure nanoscale features.
