What are the Challenges in Measuring Conduction at the Nanoscale?
Measuring conduction at the nanoscale presents several challenges. Traditional macroscopic techniques may not provide accurate results due to the small size and unique properties of nanomaterials. Techniques such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are often employed to study conduction at this scale. These methods can probe electrical properties with high spatial resolution.
