What are the Advantages and Limitations of Each Microscopy Technique?
Each microscopy technique has its own set of advantages and limitations:
SEM: High resolution and depth of field for surface imaging, but limited to surface information and requires conductive samples. TEM: Provides detailed internal structure information, but requires ultra-thin samples and complex preparation. AFM: Capable of imaging non-conductive samples in three dimensions, but can be slow and has a limited scan size. STM: Offers atomic resolution and electronic property information, but requires conductive samples and operates in ultra-high vacuum.
