What are Some Key Imaging Techniques in Nanotechnology?
Scanning Electron Microscopy (SEM) SEM uses a focused beam of electrons to generate high-resolution images of a sample's surface. It provides detailed topographical information and can achieve resolutions down to a few nanometers. This technique is widely used for characterizing nanostructures and analyzing surface features.
Transmission Electron Microscopy (TEM) TEM transmits a beam of electrons through a thin sample and captures the interaction of electrons with the material. This technique offers extremely high resolution, allowing for the visualization of internal structures at the atomic level. It is particularly useful for studying the morphology and composition of nanomaterials.
Atomic Force Microscopy (AFM) AFM employs a sharp tip that scans the sample surface, measuring forces between the tip and the surface to create a topographical map. AFM provides three-dimensional surface profiles with high resolution and is valuable for examining the mechanical properties of nanomaterials.
Scanning Tunneling Microscopy (STM) STM uses a fine tip that scans the surface, detecting electrons tunneling between the tip and the sample. This technique can image surfaces with atomic resolution and is useful for studying electrical properties and surface structures at the atomic scale.
