What advancements are being made in X-Ray Reflectometry for Nanotechnology?
Recent advancements in XRR technology include the development of high-brilliance X-ray sources and improved detectors, which enhance the sensitivity and resolution of the technique. Additionally, integration with other characterization methods, such as grazing incidence X-ray diffraction (GIXD) and ellipsometry, provides a more comprehensive understanding of nanomaterials. These advancements are pushing the boundaries of what can be achieved with XRR in nanotechnology, enabling even more precise and detailed analyses.
