There are various techniques and instruments used to measure the performance metrics in nanotechnology:
Dynamic Light Scattering (DLS): Used for measuring particle size and distribution. Scanning Electron Microscopy (SEM): Provides detailed images of nanomaterials, helping in size and morphology analysis. Transmission Electron Microscopy (TEM): Offers high-resolution imaging to study the internal structure of nanomaterials. Atomic Force Microscopy (AFM): Used for surface characterization and measuring mechanical properties. Four-Point Probe Technique: Measures electrical conductivity with high precision. BET Method: Determines surface area by nitrogen adsorption.