performance metrics

How to Measure These Metrics?

There are various techniques and instruments used to measure the performance metrics in nanotechnology:
Dynamic Light Scattering (DLS): Used for measuring particle size and distribution.
Scanning Electron Microscopy (SEM): Provides detailed images of nanomaterials, helping in size and morphology analysis.
Transmission Electron Microscopy (TEM): Offers high-resolution imaging to study the internal structure of nanomaterials.
Atomic Force Microscopy (AFM): Used for surface characterization and measuring mechanical properties.
Four-Point Probe Technique: Measures electrical conductivity with high precision.
BET Method: Determines surface area by nitrogen adsorption.

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