How to Measure I-V Characteristics at the Nanoscale?
Measuring I-V characteristics at the nanoscale requires specialized techniques and equipment:
- Scanning Tunneling Microscope (STM): Provides high spatial resolution to measure the I-V characteristics of individual nanostructures. - Atomic Force Microscope (AFM): Can be used to probe electrical properties at the nanoscale. - Four-Point Probe Method: Ensures accurate measurement by eliminating contact resistance.
