Detecting surface damage on the nanoscale requires sophisticated analytical techniques:
1. Atomic Force Microscopy (AFM): Provides high-resolution images of the surface topology, allowing for the identification of minute defects. 2. Scanning Electron Microscopy (SEM): Offers detailed surface imaging and can be used to analyze the morphological features of the damage. 3. X-ray Photoelectron Spectroscopy (XPS): Determines the chemical composition of the surface, useful for identifying chemical-induced damage. 4. Transmission Electron Microscopy (TEM): Used to examine the internal structure and defects at the atomic level.
