Achieving nanometer resolution typically involves the use of advanced microscopy techniques and instrumentation. Some of the key methods include:
Scanning Electron Microscopy (SEM): This technique uses a focused beam of electrons to create high-resolution images of a sample's surface. Transmission Electron Microscopy (TEM): TEM uses transmitted electrons to provide detailed images of the internal structure of materials. Atomic Force Microscopy (AFM): AFM employs a mechanical probe to scan a surface, providing topographical data with nanometer precision. Scanning Tunneling Microscopy (STM): STM measures the tunneling current between a conductive tip and the sample surface to generate atomic-scale images.
