Achieving higher resolution involves several advanced techniques and instruments:
1. Electron Microscopy: Techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) offer high-resolution imaging by using electron beams instead of light. 2. Atomic Force Microscopy (AFM): AFM uses a mechanical probe to scan surfaces at the atomic level, providing topographical data with high precision. 3. Super-Resolution Microscopy: Techniques like STED and PALM/STORM break the diffraction limit of light, offering resolutions well below the traditional limits of optical microscopy.
