The FWHM can be measured using various techniques such as X-ray Diffraction (XRD), Raman Spectroscopy, and Scanning Electron Microscopy (SEM). In XRD, for example, the FWHM of the diffraction peaks can be used to estimate the crystallite size using the Scherrer Equation. In spectroscopy, the FWHM of spectral lines helps in understanding the interaction between light and matter at the nanoscale.
