The working principle of STXM involves focusing a monochromatic X-ray beam onto a small spot on the sample. As the sample is scanned in a raster pattern, the transmitted X-rays are detected and used to construct an image. The intensity of the transmitted X-rays varies based on the material's absorption properties, enabling high-contrast imaging of different components within the sample. This method can be employed to study thin films, nanoparticles, and other nanostructures.
