How does MAS NMR compare to other characterization techniques in Nanotechnology?
MAS NMR complements other characterization techniques such as:
- Transmission Electron Microscopy (TEM): Offers high-resolution images but lacks chemical information. - X-ray Diffraction (XRD): Provides crystallographic information but is less effective for amorphous materials. - Atomic Force Microscopy (AFM): Measures surface topography but not atomic-level structure.
Unlike these techniques, MAS NMR provides detailed chemical, structural, and dynamic information at the atomic level, making it an invaluable tool in the comprehensive characterization of nanomaterials.
