Force spectroscopy typically involves the use of an Atomic Force Microscope (AFM) or other specialized instruments that can measure forces with high precision. In AFM-based force spectroscopy, a sharp tip attached to a flexible cantilever is brought into contact with the sample surface. As the tip interacts with the sample, the cantilever deflects, and this deflection is measured to determine the forces involved. By controlling the position and movement of the tip, researchers can obtain force-distance curves that reveal information about the mechanical properties of the sample.
