EFM is often compared to other SPM techniques such as Kelvin Probe Force Microscopy (KPFM) and Conductive AFM (C-AFM). While KPFM measures surface potential directly, EFM measures the force due to electrostatic interactions, providing complementary information. C-AFM, on the other hand, measures electrical conductivity by applying a voltage and measuring the resulting current, whereas EFM measures the electrostatic force without direct current flow.
