How Does Atomic Force Microscopy (AFM) Provide High Resolution?
AFM uses a sharp tip mounted on a cantilever to scan the surface of a sample. The tip interacts with the sample surface, and the deflection of the cantilever is measured to create a high-resolution image. AFM can achieve resolutions down to the angstrom level, making it suitable for imaging, measuring, and manipulating materials at the nanoscale.
