How does Atomic Force Microscopy (AFM) differ from other microscopy techniques?
Atomic Force Microscopy (AFM) operates by scanning a sharp tip over the surface of a sample. Unlike TEM and SEM, which use electrons, AFM relies on physical interaction between the tip and the sample surface. This technique allows for the three-dimensional profiling of surfaces at the nanometer scale and is especially useful for measuring mechanical properties such as stiffness and adhesion.
