Measuring nanoscale objects requires specialized techniques and tools. Some of the commonly used methods include:
- Atomic Force Microscopy (AFM): This technique uses a mechanical probe to scan the surface of a sample and provides high-resolution images. - Scanning Electron Microscopy (SEM): SEM uses focused beams of electrons to create detailed images of nanoscale structures. - Transmission Electron Microscopy (TEM): TEM transmits electrons through a sample to provide information about its internal structure.
