Measuring nanomaterials accurately is crucial for understanding their properties and behavior. Several advanced techniques are commonly used:
Atomic force microscopy (AFM): AFM provides high-resolution imaging at the nanoscale by scanning a sharp probe over the surface of a sample. It can measure surface topography, mechanical properties, and more. Scanning electron microscopy (SEM): SEM uses focused beams of electrons to create highly detailed images of surfaces. It is widely used for studying the morphology of nanomaterials. Transmission electron microscopy (TEM): TEM allows for the examination of the internal structure of nanomaterials by transmitting electrons through a thin sample. It provides atomic-level resolution. X-ray diffraction (XRD): XRD is used to determine the crystalline structure of materials. For nanomaterials, it can provide information about particle size, shape, and distribution. Spectroscopy: Various spectroscopy techniques, such as Raman spectroscopy and UV-Vis spectroscopy, are used to analyze the chemical composition and optical properties of nanomaterials.
