How Do These Techniques Ensure Non-Destructive Analysis?
These techniques are designed to interact with nanomaterials in ways that do not alter their intrinsic properties: - AFM uses a fine probe to scan the surface without causing damage. - SEM employs electron beams that interact with the surface, producing images without physically altering the sample. - XRD uses X-ray beams that penetrate the material and provide information based on the diffraction pattern, leaving the material intact. - Spectroscopy techniques utilize light or other forms of electromagnetic radiation to probe the material's properties without causing physical changes.