How Do Hot Carrier Effects Impact Device Performance?
Hot carriers can lead to several detrimental effects in nanoelectronic devices:
1. Carrier Injection: Energetic carriers can inject into gate oxides in MOSFETs, causing gate leakage and threshold voltage shifts. 2. Lattice Damage: High-energy carriers can create defects in the crystal lattice, leading to degradation of device performance over time. 3. Junction Breakdown: In highly scaled devices, hot carriers can cause junction breakdown, leading to device failure.
