How Can We Observe and Manipulate Screw Dislocations?
Advanced techniques such as Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM) are commonly used to observe screw dislocations in nanomaterials. These tools provide high-resolution images that help in understanding the nature and behavior of dislocations at the nanoscale. Techniques like Focused Ion Beam (FIB) and Electron Beam Lithography (EBL) can be used to manipulate and engineer dislocations to tailor the properties of nanomaterials.
