Waveforms at the nanoscale can be generated and measured using various techniques and instruments. Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) are common tools used to observe waveforms at the atomic level. These instruments work by detecting the interaction between a sharp probe and the surface of the material being studied, allowing for the visualization of waveforms. Additionally, laser spectroscopy and ultrafast optics are employed to generate and measure waveforms in nanomaterials.
