surface defects

How are Surface Defects Characterized?

Various techniques are used to characterize surface defects in nanomaterials:
Transmission Electron Microscopy (TEM): Provides high-resolution images of defects.
Scanning Tunneling Microscopy (STM): Allows for atomic-scale imaging of surface structures.
Atomic Force Microscopy (AFM): Measures topography and mechanical properties at the nanoscale.
X-ray Diffraction (XRD): Used to analyze the crystallographic structure and identify defects.

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