Several advanced techniques are used to analyze structural changes in nanomaterials:
1. Transmission Electron Microscopy (TEM): Provides high-resolution images of nanostructures, allowing for the observation of atomic arrangements. 2. X-ray Diffraction (XRD): Used to determine the crystalline structure and phase composition. 3. Scanning Tunneling Microscopy (STM): Allows for imaging and manipulation of surfaces at the atomic level. 4. Atomic Force Microscopy (AFM): Measures surface topography and mechanical properties.
