point defects

How are Point Defects Characterized?

Characterizing point defects is essential to understand their impact and optimize material properties. Several techniques are employed for this purpose:
Transmission Electron Microscopy (TEM): Provides high-resolution images to visualize defects at atomic scales.
Electron Paramagnetic Resonance (EPR): Used for detecting unpaired electrons in defect states.
X-ray Diffraction (XRD): Offers information about crystal structure and defect-induced distortions.
Scanning Tunneling Microscopy (STM): Allows for atomic-scale imaging and electronic property measurements.

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