defect analysis

How are Defects Detected?

Several advanced techniques are employed to detect and characterize defects in nanomaterials:
Transmission Electron Microscopy (TEM): Provides high-resolution images of the internal structure.
Scanning Electron Microscopy (SEM): Offers detailed surface images.
Atomic Force Microscopy (AFM): Measures surface roughness and topography.
X-ray Diffraction (XRD): Determines the crystallographic structure.
Raman Spectroscopy: Analyzes vibrational modes to identify molecular composition and defects.

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