crystalline structures

How are Crystalline Structures Characterized?

Characterizing crystalline structures at the nanoscale involves various advanced techniques:
X-ray Diffraction (XRD): A powerful tool for determining the crystallographic structure, phase, and orientation of materials.
Transmission Electron Microscopy (TEM): Provides high-resolution images and information on the crystal structure and morphology.
Scanning Tunneling Microscopy (STM): Enables atomic-scale imaging and manipulation of surfaces.
Atomic Force Microscopy (AFM): Measures the surface topography and mechanical properties at the nanoscale.

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