What is Subthreshold Swing?
The
subthreshold swing (SS) is a critical parameter in the performance of
MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors), especially as devices scale down to the
nanoscale. It represents the change in gate voltage required to increase the drain current by one order of magnitude (a factor of 10) in the subthreshold region. This region is where the MOSFET operates below the threshold voltage, which is crucial for low-power applications.
Temperature: SS is directly proportional to temperature, meaning it increases with rising temperature.
Dielectric Material: The choice of the gate
dielectric can significantly impact SS. High-k dielectrics can help reduce the SS.
Channel Length: Shorter channel lengths can lead to increased SS due to
short-channel effects.
Doping Concentration: The doping profile of the channel also plays a role. Higher doping concentrations can lead to a lower SS.
How is Subthreshold Swing Measured?
Subthreshold swing is typically measured from the
I-V characteristics of the MOSFET. By plotting the logarithm of the drain current (ID) against the gate voltage (VG), the subthreshold region can be identified. The SS is then determined from the slope of this curve in the subthreshold region, usually in units of mV/decade.
Use of High-k Dielectrics: High-k materials can reduce gate leakage and improve SS.
FinFETs: FinFET technology, with its three-dimensional structure, offers better control over the channel and can achieve lower SS.
SOI Technology: Silicon-on-Insulator (SOI) technology can help reduce short-channel effects, thus improving SS.
Multi-Gate Transistors: Devices like
Gate-All-Around (GAA) FETs offer superior electrostatic control, leading to better SS.