instrument wear and tear

Why is it Critical in Nanotechnology?

In nanotechnology, even slight wear and tear can result in significant inaccuracies. Instruments such as Atomic Force Microscopes (AFM), Scanning Electron Microscopes (SEM), and Transmission Electron Microscopes (TEM) require pristine conditions to function correctly. Any degradation can lead to errors in data collection, which can compromise research outcomes and applications.

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