Why is Atomic Force Microscopy (AFM) important in nanotechnology?
AFM uses a sharp tip attached to a cantilever to scan the surface of a sample. The tip interacts with the surface forces, causing the cantilever to deflect. This deflection is measured to create a topographical map of the surface. AFM can measure features at the nanometer scale and is valuable for studying surface roughness, mechanical properties, and molecular interactions.
