elemental analysis

Which Techniques are Commonly Used?

Several analytical techniques are employed in the field of nanotechnology for elemental analysis:

Energy Dispersive X-ray Spectroscopy (EDS): Used in conjunction with Scanning Electron Microscopy (SEM) to provide elemental composition data at micro and nano scales.
X-ray Photoelectron Spectroscopy (XPS): Offers surface-sensitive analysis, ideal for studying thin films and surface coatings.
Inductively Coupled Plasma Mass Spectrometry (ICP-MS): Provides high sensitivity and is capable of detecting trace elements in samples.
Transmission Electron Microscopy (TEM): Combined with EDS, it provides elemental analysis at atomic resolution.
Auger Electron Spectroscopy (AES): Useful for analyzing the surface composition and determining the chemical states of elements.