Several instruments in nanotechnology require regular calibration, including: - Atomic Force Microscopes (AFM): Used for imaging, measuring, and manipulating matter at the nanoscale. - Scanning Electron Microscopes (SEM): Provide high-resolution images of nanoscale structures. - Transmission Electron Microscopes (TEM): Used for detailed internal imaging of nanomaterials. - Nanoparticle Size Analyzers: Measure the size distribution of nanoparticles in a sample. - Nanoindenters: Measure the mechanical properties of materials at the nanoscale.
