Several scattering techniques are commonly used in nanotechnology, including:
1. Dynamic Light Scattering (DLS): Measures the size distribution of small particles in suspension by analyzing the fluctuations in light intensity due to Brownian motion. 2. Small-Angle X-ray Scattering (SAXS): Provides information about size, shape, and internal structure of nanomaterials by measuring the scattering of X-rays at small angles. 3. X-ray Diffraction (XRD): Determines the crystallographic structure, phase, and orientation of materials by analyzing the diffraction patterns of X-rays. 4. Neutron Scattering: Similar to X-ray scattering but uses neutrons, providing complementary information, especially useful for studying magnetic properties and hydrogen-containing materials. 5. Electron Scattering: Utilized in electron microscopy techniques like TEM and SEM to obtain high-resolution images and structural information about nanomaterials.
