What Types of Reflectometry are Used in Nanotechnology?
Several types of reflectometry are used in nanotechnology, including:
X-ray Reflectometry (XRR): Utilizes X-rays to probe the electron density profile perpendicular to the surface. Neutron Reflectometry (NR): Uses neutrons to measure the scattering length density profile, useful for studying soft matter and biological samples. Optical Reflectometry: Employs visible light to analyze thin films, often using techniques like ellipsometry.
